• DocumentCode
    2039457
  • Title

    Graphical analysis of MC/DC using automated software testing

  • Author

    Mitra, Porshia ; Chatterjee, Shreya ; Ali, Nikita

  • Author_Institution
    Dept. of IT, West Bengal Univ. of Technol., Kolkata, India
  • Volume
    3
  • fYear
    2011
  • fDate
    8-10 April 2011
  • Firstpage
    145
  • Lastpage
    149
  • Abstract
    Testing has traditionally been one of the main techniques contributing to high software dependability and quality. Each stage in software development has a corresponding testing activity. Testing activity consumes about 50% of software development resources, so any technique aiming at reducing software-testing costs is likely to reduce software development costs. Proposed by NASA in 1994, the Modified Condition/Decision Coverage (MC/DC) criterion is a testing strategy required, among other practices, by the RTCA DO-178B. MC/DC is a white box testing criterion aiming at proving evidence that all clauses involved in a predicate can influence the predicate value in the required way. It subsumes other well-known coverage criteria such as statement and decision coverage. Our work involves a thorough study of the MC/DC criterion and our approach is organized in the following way. We automate the generation of number of test cases required to satisfy the MC/DC criterion. To this end we develop a generic algorithm that would for any given predicate, compute the minimum number of test cases that would cover the MC/DC criterion for this predicate.
  • Keywords
    cost reduction; program testing; software development management; MC/DC criterion; Modified Condition/Decision Coverage criterion; NASA; RTCA DO-178B; automated software testing; generic algorithm; graphical analysis; software dependability; software development cost reduction; software development resource; white box testing criterion; Arrays; Complexity theory; Flow graphs; Optimization; Software; Software testing; adjacency matrix; cfg; complexity; control flow graph; modified condition; testing; white box;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Computer Technology (ICECT), 2011 3rd International Conference on
  • Conference_Location
    Kanyakumari
  • Print_ISBN
    978-1-4244-8678-6
  • Electronic_ISBN
    978-1-4244-8679-3
  • Type

    conf

  • DOI
    10.1109/ICECTECH.2011.5941819
  • Filename
    5941819