DocumentCode
2039553
Title
Simulation of Via Interconnects Using Physics-Based Models and Microwave Network Parameters
Author
Rimolo-Donadio, Renato ; Stepan, Andrzej J. ; Bruns, Heinz-Dietrich ; Drewniak, James L. ; Schuster, Christian
Author_Institution
Inst. fur Theor. Elektrotechnik, Tech. Univ. of Hamburg-Harburg, Hamburg
fYear
2008
fDate
12-15 May 2008
Firstpage
1
Lastpage
4
Abstract
In this paper, the simulation of via interconnects in multilayered printed circuit boards (PCBs) and packages combining physics-based via models and microwave network theory will be discussed. The description of the via in terms of network parameters, partitioning of the system, and combination of partial results will be addressed. Two alternatives to combine the results are compared, namely multiplication of ABCD matrices and the segmentation method based on S-parameters. The goal of this work is to develop a fast and accurate modeling strategy for via arrays in the multi-gigabit range, extensible to an arbitrary number of elements, and suitable for automation and design optimization. The obtained results show good agreement with respect to 3D electromagnetic field simulations and measurements up to 20 GHz. Hence, this approach is a promising technique for efficient system-level simulation of interconnects.
Keywords
S-parameters; integrated circuit interconnections; integrated circuit modelling; microwave integrated circuits; printed circuit design; 3D electromagnetic field simulations; S-parameters; design optimization; microwave network parameters; microwave network theory; multilayered printed circuit boards; physics-based via models; system-level simulation; via arrays; via interconnect simulation; Circuit simulation; Design automation; Design optimization; Electromagnetic fields; Integrated circuit interconnections; Microwave theory and techniques; Packaging; Printed circuits; Scattering parameters; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
Conference_Location
Avignon
Print_ISBN
978-1-4244-2317-0
Electronic_ISBN
978-1-4244-2318-7
Type
conf
DOI
10.1109/SPI.2008.4558352
Filename
4558352
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