• DocumentCode
    2041218
  • Title

    Field Emission Properties of Metallic Nanowires Grown in Polymer Ion-track Membranes

  • Author

    Dangwal, A. ; Lysenkov, D. ; Muller, Gunter ; Maurer, F. ; Brötz, J. ; Fuess, H.

  • Author_Institution
    Dept. of FB C-Physics, Wuppertal Univ.
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    131
  • Lastpage
    132
  • Abstract
    The field emission (FE) properties of randomly distributed free-standing Cu and Ni nanowires on thin metallic substrates were measured. The wires were grown in the etched ion-tracked pores of polycarbonate membranes with various diameters of 120-330 nm, lengths of 8-18 mum and number densities of 106-108 emitters/cm2. The emission site density and current distribution of the nanowire cathodes were measured with the field emission scanning microscope (FESM) at about 10-7 Pa. All samples showed similar onset fields for 1 nA of some V/mum but rather different emission uniformity. At 5 V/mum the free standing Cu and Ni nanowires provided less than 4times104 emitters/cm2 , while the bundled Cu and Au-coated Ni nanowires yielded more than 105 emitters/cm2. For the latter sample about 1.6times106 emitters/cm2 were found at 18 V/mum, i.e. about than 10 % of the nanowires emitted
  • Keywords
    copper; field emission; nanowires; nickel; scanning electron microscopy; 120 to 330 nm; 8 to 18 micron; Cu; Ni; current distribution; emission site density; emission uniformity; field emission properties; field emission scanning microscope; metallic nanowires; polymer ion-track membranes; thin metallic substrates; Biomembranes; Cathodes; Current distribution; Current measurement; Density measurement; Etching; Iron; Nanowires; Polymers; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335392
  • Filename
    4134494