DocumentCode
2041651
Title
Recent advances in Anisotropic Conductive Adhesives (ACAs) technology: Materials and processing
Author
Paik, K.W.
Author_Institution
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2012
fDate
13-16 Dec. 2012
Firstpage
1
Lastpage
3
Abstract
New ACA materials and processing technologies innovation have been made at various advanced packaging applications such as FOB, FOF, COF, COG, TSP (Touch Screen Panel) and 3D-TSV (Through Silicon Via) assemblies. In ACA materials innovation, noble nanofiber ACA materials with conductive particles incorporated polymer nanofiber finally solve the electrical shortage and unstable contact resistance problems of less than 20 micron ultra-fine pitch COG and COF interconnection, because conductive particle movement can be significantly limited by polymer nanofibers. In addition, new solder ACA materials can significantly solve the current handling capability and reliability limitation of conventional ACAs, because solder ACFs form solder alloy metallurgical joints rather than physical contact based joints of conventional ACFs with metal conductor particles. And new epoxy based photo Active(PA)-ACFs are also introduced to reduce the ACF bonding temperature down to 110 C. In addition, there were progresses made in the area of ACA processing technologies too. New vertical ultrasonic ACA bonding technology provides less than 3 seconds ACA bonding time, reduced assembly thermal damage, good adhesion strength, good contact resistances, and reliability compared with the conventional thermo-compression bonding method. The ultrasonic ACA bonding method has been successfully adapted at the touch screen panel(TSP), FOB and FOF assembly applications. Another ACA processing innovation is the invention of the wafer-level ACA process which significantly reduces the number of processing steps resulting in low cost COB, COF, COG assemblies using ACAs. Furthermore, this wafer-level ACA processing method can be successfully extended to the 3D-TSV vertical interconnection applications too.
Keywords
adhesives; contact resistance; fine-pitch technology; integrated circuit bonding; integrated circuit interconnections; lead bonding; nanofibres; polymer fibres; reliability; solders; three-dimensional integrated circuits; wafer level packaging; 3D-TSV vertical interconnection applications; ACA processing technology; ACA technology; ACF bonding; COF interconnection; FOB; FOF assembly applications; TSP; adhesion strength; advanced packaging applications; anisotropic conductive adhesive technology; conductive particles; contact resistance problems; contact resistances; epoxy based photoactive ACF; metal conductor particles; nanofiber ACA materials; physical contact based joints; polymer nanofiber; reduced assembly thermal damage; reliability; solder ACA materials; solder alloy metallurgical joints; thermo-compression bonding method; through silicon via assembly; touch screen panel; ultrafine pitch COG; ultrasonic ACA bonding method; vertical ultrasonic ACA bonding technology; wafer-level ACA process; wafer-level ACA processing method;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location
Lantau Island
Print_ISBN
978-1-4673-4945-1
Electronic_ISBN
978-1-4673-4943-7
Type
conf
DOI
10.1109/EMAP.2012.6507831
Filename
6507831
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