DocumentCode
2041681
Title
Potential-assisted assembly of thiol-based materials for reliable copper-epoxy interface
Author
Kwok, Stephen C. T. ; Yuen, M.M.F.
Author_Institution
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear
2012
fDate
13-16 Dec. 2012
Firstpage
1
Lastpage
5
Abstract
Despite the fact that copper has continuously being used as leadframe materials in electronic packaging, adhesion strength between copper-epoxy joint is prone to be weaken during reliability test. In order to solve this problem, thiol-based self-assembled material (SAM) is applied as coupling agent between copper and epoxy system. A remarkable interfacial adhesion improvement was reported by different groups [1-2]. This work reports on adhesion enhancement effects of self-assembled organothiol treatment on copper/epoxy interface, as well as a significant reduction in treatment time under the influence of electric potential. The interfacial adhesion has a maximum enhancement of 20-fold through the treatment due to improved linkage between copper substrate and epoxy layer by chemisorbed organothiol molecules. The treatment time was greatly reduced by 32 times to 1800s with the proposed preparation method and maximum adhesion strength up to 97.2±6.1 Jm-2 was demonstrated. The use of potential enhances preparation efficiency with adhesion improvement comparable to passive adsorption method make up in 16hrs.
Keywords
assembling; copper alloys; electronics packaging; materials preparation; reliability; Cu; SAM; adhesion strength; chemisorbed organothiol molecules; copper-epoxy joint; electric potential; electronic packaging; epoxy layer; epoxy system; interfacial adhesion improvement; leadframe materials; passive adsorption method; potential-assisted assembly; reliable copper-epoxy interface; self-assembled organothiol treatment; thiol-based materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location
Lantau Island
Print_ISBN
978-1-4673-4945-1
Electronic_ISBN
978-1-4673-4943-7
Type
conf
DOI
10.1109/EMAP.2012.6507832
Filename
6507832
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