Compositional Variations of Co-based Thin films for Biasing Magnets in GMR/TMR Read Heads

Author

Pinitsoontorn, S. ; Cerezo, A. ; Petford-Long, A.K.

Author_Institution

Dept. of Mater., Oxford Univ.

fYear

2006

fDate

38899

Firstpage

183

Lastpage

184

Abstract

A combination of several techniques including transmission electron microscopy, X-ray diffraction, and 3DAP are used to characterize ion beam deposited Co₇₀Cr₁₀Pt₂₀ thin films on Cr seed layers. The films are deposited at two different angles, 0 and 25deg. Results show increased coercivity, lower stress and smaller average grain size for the film deposited at a larger deposition angle

Keywords

X-ray diffraction; chromium alloys; cobalt alloys; coercive force; giant magnetoresistance; grain size; ion beam assisted deposition; magnetic heads; magnetic thin films; permanent magnets; platinum alloys; transmission electron microscopy; tunnelling magnetoresistance; 3DAP; CoCrPt; GMR/TMR read head biasing magnets; X-ray diffraction; coercivity; grain size; internal stresses; magnetic thin films; seed layers; transmission electron microscopy; Chromium; Coercive force; Electron beams; Ion beams; Magnetic heads; Magnets; Sputtering; Transistors; Transmission electron microscopy; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International

Conference_Location

Guilin

Print_ISBN

1-4244-0401-0

Type

conf

DOI

10.1109/IVNC.2006.335419

Filename

4134521