• DocumentCode
    2043288
  • Title

    Hard mold UV nanoimprint lithography process

  • Author

    Yinsheng Zhong ; Yuen, M.M.F.

  • Author_Institution
    Dept. of Mech. Eng., HKUST, Kowloon, China
  • fYear
    2012
  • fDate
    13-16 Dec. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Low temperature and low pressure nano-pattern fabrication process is presented. Hard mold UV nanoimprint lithography, processed by SUSS MicroTec MA6, was used for sub-100nm pattern fabrication. The process details including mold fabrication are provided. A comparison between patterns on soft mold and hard mold is given. The governing parameters in hard mold NIL process are identified. UV curable resin AMONIL MMS4 was used as a UV-curable photo resist (PR) in the process, while 4inch Si wafer was the imprinted substrate. Various resist coating thicknesses from 200nm to 500nm were tested. Imprint force was applied by the high pressure N2 gas, in order to get uniform force distribution over the whole imprint area. 88nm width line patterns were transferred successfully to the resin layer. Results evaluation was done by using AFM and SEM pictures. Image from optical microscope is also shown for reference.
  • Keywords
    atomic force microscopy; moulding; nanofabrication; nanolithography; photoresists; scanning electron microscopy; ultraviolet lithography; AFM; PR; SEM pictures; SUSS MicroTec MA6; Si; UV curable resin AMONIL MMS4; UV-curable photoresist; hard mold UV nanoimprint lithography process; high pressure N2 gas; imprint force; imprinted substrate; line patterns; low pressure nanopattern fabrication process; low temperature nanopattern fabrication process; mold fabrication; optical microscope; resin layer; resist coating; size 200 nm to 500 nm; size 4 inch; size 88 nm; soft mold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
  • Conference_Location
    Lantau Island
  • Print_ISBN
    978-1-4673-4945-1
  • Electronic_ISBN
    978-1-4673-4943-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2012.6507892
  • Filename
    6507892