DocumentCode
2043819
Title
Charge Emissions from the Plasma Photogerated in Channels of SWNTs
Author
Guo, Deng-Zhu ; Chen, Qi ; Zhang, Geng-Min ; Zhang, Zhao-Xiang ; Gu, Zhen-Nan ; Xue, Zeng-Quan
Author_Institution
Dept. of Electron., Peking Univ., Beijing
fYear
2006
fDate
38899
Firstpage
331
Lastpage
331
Abstract
Summary form only given. In recent years it has been reported that nanomaterials such as single-walled carbon nanotubes (SWNTs), silicon nanowires, and polyaniline nanofibers could have an abnormal photothermal effect under a camera flashlight. We have also investigated the visible-light-induced split of water confined in channels of SWNTs. In this paper, we will focus on the charge emission phenomena when the SWNT sample in ultrahigh vacuum is irradiated with a fast light exposure. We designed a special experimental procedure to monitor the positive and negative charges launched from the irradiated SWNT sample. Indeed, both positive and negative charge emissions have been recorded. Originally, such phenomena could only be observed occasionally, but now we can definitely obtain the charge emissions for each time of fast-light exposure. We found that the charge intensity is related to the residual gas adsorption, the collecting voltage, the external magnetic field, and the intensity of the input light. Some plasma characteristics of the photogenerated charges have been determined. We suppose that the nano-confinement of the adsorbed residual gases in the channels of SWNTs would play a key role in such phenomena
Keywords
adsorption; carbon nanotubes; photothermal effects; radiation effects; solid-state plasma; C; SWNT channels; adsorbed residual gas nanoconfinement; charge intensity; collecting voltage; fast light irradiation; negative charge emissions; photogenerated plasma; photothermal effect; positive charge emissions; residual gas adsorption; single-walled carbon nanotubes; ultrahigh vacuum; Cameras; Carbon nanotubes; Fast light; Monitoring; Nanomaterials; Nanowires; Photothermal effects; Plasma confinement; Silicon; Voltage; Charge Emissions; Photothermal Effect; Plasma; SWNTs;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335493
Filename
4134595
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