• DocumentCode
    2044020
  • Title

    A numerical approach far the dielectric constant extraction from resonant cavity measurements

  • Author

    Kouki, A.B. ; Khebir, A. ; Ghannouchi, F.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    2
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    968
  • Abstract
    A numerical approach based on the combination of the finite element method with accurate root-finding algorithms and with efficient database management techniques has been developed and implemented for the complex dielectric constant evaluation from measured resonant frequency and quality factor data. The validity of the approach is demonstrated with number of tests where measured data is supplied and the corresponding complex permittivity value is extracted
  • Keywords
    Newton-Raphson method; Q-factor measurement; cavity resonators; computational complexity; convergence of numerical methods; electrical engineering computing; finite element analysis; learning (artificial intelligence); microwave measurement; parameter estimation; permittivity measurement; physics computing; root loci; table lookup; Newton-Raphson algorithm; accurate root-finding algorithms; automated learning procedure; complex dielectric constant evaluation; computation time; convergence; cylindrical cavity; dielectric constant extraction; efficient database management techniques; efficient iterative scheme; finite element method; microwave measurement; numerical approach; quality factor data; resonant cavity measurements; table lookup; Data mining; Databases; Dielectric constant; Dielectric measurements; Finite element methods; Frequency measurement; Permittivity measurement; Q factor; Quality management; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
  • Conference_Location
    Brussels
  • Print_ISBN
    0-7803-3312-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1996.507310
  • Filename
    507310