DocumentCode
2044473
Title
The influence of mechanical stresses an the local dielectric strength of HV extruded cables
Author
Amyot, N. ; David, E. ; Lee, S.Y. ; Lee, L.H.
Author_Institution
Hydro-Quebec, IREQ, Varennes, Que., Canada
fYear
2000
fDate
2000
Firstpage
123
Lastpage
126
Abstract
Mechanical stresses from manufacturing always exist in extruded HV cables. These stresses are generated by the temperature gradients created by the temperature decrease after extrusion or by the difference between thermal expansion coefficients of two different materials in contact (for example metal-polymer interface), These stresses are not uniformly distributed in the cable insulation bulk material. Five different HV cables were analyzed with respect to residual mechanical stresses and dielectric breakdown strength. Photoelastic measurements have been carried out and show that residual stresses range from 2.2 to 5.1 MPa and are located near the conductor shield. Breakdown strength measurements with respect to mechanical stresses have also been performed up to the maximum stresses observed
Keywords
XLPE insulation; electric breakdown; electric strength; extrusion; internal stresses; power cable insulation; CTE difference; HV extruded cables; XLPE; cable insulation; conductor shield; dielectric breakdown strength; local dielectric strength; mechanical stresses influence; metal-polymer interface; photoelastic measurements; residual mechanical stresses; temperature decrease; temperature gradients; Conducting materials; Dielectric materials; Dielectric measurements; Inorganic materials; Manufacturing; Mechanical cables; Residual stresses; Stress measurement; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
Conference_Location
Anaheim, CA
ISSN
1089-084X
Print_ISBN
0-7803-5931-3
Type
conf
DOI
10.1109/ELINSL.2000.845472
Filename
845472
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