• DocumentCode
    2044473
  • Title

    The influence of mechanical stresses an the local dielectric strength of HV extruded cables

  • Author

    Amyot, N. ; David, E. ; Lee, S.Y. ; Lee, L.H.

  • Author_Institution
    Hydro-Quebec, IREQ, Varennes, Que., Canada
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    123
  • Lastpage
    126
  • Abstract
    Mechanical stresses from manufacturing always exist in extruded HV cables. These stresses are generated by the temperature gradients created by the temperature decrease after extrusion or by the difference between thermal expansion coefficients of two different materials in contact (for example metal-polymer interface), These stresses are not uniformly distributed in the cable insulation bulk material. Five different HV cables were analyzed with respect to residual mechanical stresses and dielectric breakdown strength. Photoelastic measurements have been carried out and show that residual stresses range from 2.2 to 5.1 MPa and are located near the conductor shield. Breakdown strength measurements with respect to mechanical stresses have also been performed up to the maximum stresses observed
  • Keywords
    XLPE insulation; electric breakdown; electric strength; extrusion; internal stresses; power cable insulation; CTE difference; HV extruded cables; XLPE; cable insulation; conductor shield; dielectric breakdown strength; local dielectric strength; mechanical stresses influence; metal-polymer interface; photoelastic measurements; residual mechanical stresses; temperature decrease; temperature gradients; Conducting materials; Dielectric materials; Dielectric measurements; Inorganic materials; Manufacturing; Mechanical cables; Residual stresses; Stress measurement; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845472
  • Filename
    845472