• DocumentCode
    2046386
  • Title

    Enhanced leakage reduction technique by gate replacement

  • Author

    Yuan, Lin ; Qu, Gang

  • Author_Institution
    Electr. & Comput. Eng. Dept., Maryland Univ., College Park, MD, USA
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    47
  • Lastpage
    50
  • Abstract
    Input vector control (IVC) technique utilizes the stack effect in CMOS circuit to apply the minimum leakage vector (MLV) to the circuit at the sleep mode to reduce leakage. Additional logic gates can be inserted as control points to make it more effective. In this paper, we propose a gate replacement technique that further enhances the leakage reduction. The basic idea is to replace a gate that is in its worst leakage state by another library gate while keeping the circuit´s correct functionality at the active mode. We also develop a divide-and-conquer approach that integrates a fast gate replacement heuristic, an optimal MLV search strategy for tree circuit, and a genetic algorithm to connect the tree circuits. We conduct experiments on the MCNC91 benchmark circuits. The results reveal that our technique can reduce additional 10% to 24% leakage over the best known IVC methods and the optimal MLV with no delay penalty and little area increase.
  • Keywords
    CMOS integrated circuits; circuit optimisation; divide and conquer methods; genetic algorithms; leakage currents; logic design; logic gates; low-power electronics; CMOS circuit; IVC technique; MCNC91 benchmark circuit; MLV; divide-and-conquer approach; gate replacement; genetic algorithm; input vector control; leakage reduction technique; logic gates; minimum leakage vector; tree circuit; Algorithm design and analysis; CMOS logic circuits; CMOS technology; Ducts; Educational institutions; Genetic algorithms; Leakage current; Libraries; Logic gates; Permission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings. 42nd
  • Print_ISBN
    1-59593-058-2
  • Type

    conf

  • DOI
    10.1109/DAC.2005.193771
  • Filename
    1510290