• DocumentCode
    2046542
  • Title

    Microelectronics packaging processing using focused high power electron beams

  • Author

    Yau, You-Wen ; Booke, Michael A. ; Sandhu, Nirmal S. ; Fulton, Joseph J.

  • Author_Institution
    IBM Corp., Hopewell Junction, NY, USA
  • fYear
    1991
  • fDate
    11-16 May 1991
  • Firstpage
    636
  • Lastpage
    638
  • Abstract
    It has been demonstrated that focused high-power electron beams are alternatives for patterning next-generation multilayer ceramic packaging. The advantages of using high-power electron beams include high resolution, flexibility, and direct write capability. Higher-density packages can be fabricated using this process tool technology. Electron beams are software-driven. Quick turnaround time can be accomplished for customized packaging circuit designs. Electron beams can efficiently transfer energy to thermally remove ceramic green-sheet materials. Electron-beam machining of ceramic green sheets has been investigated. Experimental results indicate small-size and/or high density via holes can be generated. It is demonstrated that line patterns can be delineated
  • Keywords
    ceramics; electron beam lithography; packaging; ceramic green-sheet materials; customized packaging; direct write capability; flexibility; focused high power electron beams; line patterns; next-generation multilayer ceramic packaging; process tool technology; resolution; turnaround time; via holes; Ceramics; Electron beams; Fabrication; Machining; Microelectronics; Nonhomogeneous media; Packaging machines; Punching; Semiconductor device packaging; Sheet materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1991. Proceedings., 41st
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-0012-2
  • Type

    conf

  • DOI
    10.1109/ECTC.1991.163946
  • Filename
    163946