Proceedings of 1995 IEEE International Test Conference (ITC)

fYear

1995

fDate

21-25 Oct. 1995

Abstract

The following topics were dealt with: RAM BIST and intelligent testing; mixed-signal device testing; quality, I_DDQ, and the DUT interface; delay testing; microprocessor testing; MCM test methods; test SPC and support systems; test generation and fault simulation; high-level test synthesis and DFT; contract manufacturing test challenges; test quality, stuck-at faults, and PPM rejects; design for testability; test cost analysis applications; high-speed ATE architectures and timing; defect detection and diagnosis; performance-driven BIST insertion; IC defect detection; boundary scan; functional level test; IC testing and diagnosis; synthesis for testability; software testing; unconventional test development; BIST pattern generation and compaction; design and simulation; ATE and board test systems; IC current-test techniques; deep-submicron test; unpowered opens testing.

Keywords

automatic test equipment; automatic test software; boundary scan testing; built-in self test; computer testing; design for testability; fault diagnosis; high level synthesis; integrated circuit testing; logic testing; multichip modules; printed circuit testing; production testing; program testing; quality control; BIST pattern generation; DFT; DUT interface; I/sub DDQ/ mesurement; IC diagnosis; IC testing; MCM test methods; PPM rejects; RAM BIST; boundary scan; contract manufacturing test challenges; defect detection; delay testing; design for testability; fault simulation; functional level test; high-level test synthesis; high-speed ATE architectures; intelligent testing; microprocessor testing; mixed-signal device testing; performance-driven BIST insertion; quality; simula; software testing; stuck-at faults; synthesis for testability; test SPC; test cost analysis; test generation; test quality; test support systems; timing; unconventional test development;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC, USA

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529812

Filename

529812