• DocumentCode
    2046969
  • Title

    A SI incremental A/D converter for IC sensor interfaces

  • Author

    Yufera, Alberto ; Rueda, Adoracion

  • Author_Institution
    Dept. de Diseno de Circuitos Analogico, Centro Nacional de Microelectronica, Sevilla, Spain
  • Volume
    2
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    1029
  • Abstract
    In this paper an incremental analog-to-digital converter (ADC) designed as part of the signal-conditioning circuitry of a pressure sensor interface is presented. For technological compatibility the switched-current (SI) technique has been used which does not need double polysilicon CMOS process. To overcome the lack of precision of this technique a conversion algorithm with digital correction has been chosen and circuit enhancements has been sought. Electrical simulations show the correct error cancellation performed by the proposed converter. Resolution of 10 bits is achieved for a 4 MHz master clock. A 1 μm CMOS prototype is being tested and some experimental results are given
  • Keywords
    CMOS integrated circuits; SPICE; analogue-digital conversion; circuit analysis computing; computerised instrumentation; electric sensing devices; integrating circuits; pressure sensors; signal processing equipment; switched current circuits; 1 micron; 4 MHz; CMOS prototype; HSPICE; IC sensor interfaces; circuit enhancements; conversion algorithm; correct error cancellation; current-mode; digital correction; dynamic current memory cell; electrical simulations; incremental A/D converter; piezoresistive sensor; pressure sensor interface; signal-conditioning circuitry; switched-current integrator technique; Analog-digital conversion; CMOS process; CMOS technology; Circuit simulation; Delta-sigma modulation; Integrated circuit technology; Sensor systems; Signal generators; Signal processing; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
  • Conference_Location
    Brussels
  • Print_ISBN
    0-7803-3312-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1996.507321
  • Filename
    507321