• DocumentCode
    2047126
  • Title

    Proposal to simplify development of a mixed signal test standard

  • Author

    Whetsel, Lee

  • Author_Institution
    Texas Instrum., USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    400
  • Lastpage
    409
  • Abstract
    This paper proposes a method to simplify development of a mixed signal test standard by assigning the analog interconnect test to IEEE 1149.1 and the analog measurement test to IEEE P1149.4
  • Keywords
    IEEE standards; fault diagnosis; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; IEEE 1149.1; IEEE P1149.4; analog interconnect test; analog measurement test; mixed signal test standard; Analog integrated circuits; Circuit testing; Instruments; Integrated circuit interconnections; Integrated circuit testing; Mirrors; Pins; Probes; Proposals; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557037
  • Filename
    557037
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2047126