DocumentCode
2047487
Title
Modeling indices of reliability for ramified embedded systems
Author
Sydor, Andriy
Author_Institution
Automated Control Syst. Dept., Lviv Polytech. Nat. Univ., Lviv
fYear
2008
fDate
21-24 May 2008
Firstpage
75
Lastpage
76
Abstract
A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system´s output elements. Main reliability indices of ramified embedded systems are examined in this paper.
Keywords
micromechanical devices; reliability; indices modeling; micromechanical devices; ramified embedded systems; reliability index; Actuators; Aging; Embedded system; Information processing; Magnetic sensors; Mechanical sensors; Microelectronics; Optical devices; Optical sensors; Sensor systems; Rayleigh distribution; embedded systems; generating functions; reliability indices;
fLanguage
English
Publisher
ieee
Conference_Titel
Perspective Technologies and Methods in MEMS Design, 2008. MEMSTECH 2008. International Conference on
Conference_Location
Polyana
Print_ISBN
978-966-2191-00-4
Type
conf
DOI
10.1109/MEMSTECH.2008.4558742
Filename
4558742
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