A comparison of test requirements, methods, and results for seven MCM products

Author

Flint, Andrew

Author_Institution

Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA

fYear

1995

fDate

21-25 Oct 1995

Firstpage

202

Lastpage

207

Abstract

This paper presents seven MCM designs, compares and contrasts the test approaches used in each design, and lists test solutions and recommendations that can be extended to future MCM technology. Important topics covered include design-for-testability, logic simulation, and fault diagnosis. Unique to this discussion are details concerning the refinement of test practices required to support product transition from prototype design to volume manufacturing

Keywords

VLSI; application specific integrated circuits; automatic test software; built-in self test; circuit analysis computing; computer testing; design for manufacture; design for testability; digital signal processing chips; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; microcontrollers; multichip modules; production testing; ASIC; ATPG; BIST; DRAM; MCM products; VLSI tester; behavioral model; design-for-testability; fault diagnosis; flash memory; gate level model; hardware models; logic simulation; memory IC; microcontroller; processing elements; product transition; prototype design; simulation environment; test methods; test requirements; volume manufacturing; Application specific integrated circuits; Assembly; Automatic testing; Control systems; Fault diagnosis; Flash memory; Microcontrollers; Prototypes; Random access memory; Refining;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529834

Filename

529834