• DocumentCode
    2051262
  • Title

    Risk assessment sampling plans for non-standard (maverick) material

  • Author

    Core, Daniel P.

  • Author_Institution
    Intel Corp., Aloha, OR, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    595
  • Lastpage
    604
  • Abstract
    Reliability evaluations are conducted to determine if non-standard material meets a company´s reliability requirements and whether or not it may be sold to customers for revenue as normal material. Material is considered to be non-standard if it was misprocessed, fails to conform to specifications or any criterion deemed to critically affect the performance or reliability of the device, or demonstrates characteristics that result in a substantial concern about the reliability of the product. A methodology for establishing sampling plans for reliability experiments designed to evaluate non-standard material is discussed in this paper. Two case studies from Intel Corporation are shown
  • Keywords
    binomial distribution; design of experiments; reliability theory; risk management; semiconductor device reliability; Intel Corporation; binomial statistics; device reliability; material reliability; maverick material; methodology; nonstandard material; operating characteristic curve; product reliability; reliability evaluations; reliability experiment design; risk assessment sampling plans; semiconductor industry; Bismuth; Degradation; Humidity; Materials reliability; Reliability engineering; Reliability theory; Risk management; Sampling methods; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557111
  • Filename
    557111