DocumentCode
2051262
Title
Risk assessment sampling plans for non-standard (maverick) material
Author
Core, Daniel P.
Author_Institution
Intel Corp., Aloha, OR, USA
fYear
1996
fDate
20-25 Oct 1996
Firstpage
595
Lastpage
604
Abstract
Reliability evaluations are conducted to determine if non-standard material meets a company´s reliability requirements and whether or not it may be sold to customers for revenue as normal material. Material is considered to be non-standard if it was misprocessed, fails to conform to specifications or any criterion deemed to critically affect the performance or reliability of the device, or demonstrates characteristics that result in a substantial concern about the reliability of the product. A methodology for establishing sampling plans for reliability experiments designed to evaluate non-standard material is discussed in this paper. Two case studies from Intel Corporation are shown
Keywords
binomial distribution; design of experiments; reliability theory; risk management; semiconductor device reliability; Intel Corporation; binomial statistics; device reliability; material reliability; maverick material; methodology; nonstandard material; operating characteristic curve; product reliability; reliability evaluations; reliability experiment design; risk assessment sampling plans; semiconductor industry; Bismuth; Degradation; Humidity; Materials reliability; Reliability engineering; Reliability theory; Risk management; Sampling methods; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557111
Filename
557111
Link To Document