• DocumentCode
    2051757
  • Title

    Multi-channel, high-density, ultra-low capacitance arrays for ESD and surge protection

  • Author

    Marreiro, David ; Shastri, Sudhama ; Liu, Mingjiao ; Keena, Thomas ; Khan, Shamsul ; Salih, Ali ; Etter, Steve ; Grivna, Gordy ; Parsey, John ; Ashton, Robert ; Loo, Suem ; Jones, Rob ; Robinson, Lon ; Buhrman, Bob ; Hurley, Ryan

  • Author_Institution
    ON Semicond., Phoenix, AZ
  • fYear
    2008
  • fDate
    April 27 2008-May 1 2008
  • Firstpage
    637
  • Lastpage
    638
  • Abstract
    A novel protection device providing ultra-low line capacitance and improved ESD (J. E. Vinson et al., 2003) and surge capability is presented. Applications include stand-alone protection arrays and integrated protection in baseband- or RF-filters. A proprietary epitaxial layer and isolation capability enable high levels of surge power handling capability, while keeping line capacitance low and reducing device footprint. The response of the device to ESD and surge stresses is investigated at wafer- and package-level. Process condition variations and derived structures are studied, along with a consideration of issues related to the measurement of capacitance, ESD and surge capability.
  • Keywords
    Zener diodes; arrays; electrostatic discharge; epitaxial layers; radiofrequency filters; surge protection; wafer level packaging; ESD; RF filters; baseband filters; integrated protection; isolation capability; multichannel high-density ultralow capacitance arrays; package-level process; proprietary epitaxial layer; protection device; surge power handling capability; surge protection; surge stresses; wafer level process; Capacitance measurement; Costs; Electrostatic discharge; Packaging; Parasitic capacitance; Semiconductor diodes; Stress; Surge protection; Surges; Wafer scale integration; ESD; Low-capacitance; Zener diode; protection array; surge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    978-1-4244-2049-0
  • Electronic_ISBN
    978-1-4244-2050-6
  • Type

    conf

  • DOI
    10.1109/RELPHY.2008.4558964
  • Filename
    4558964