DocumentCode
2052398
Title
Modifying the nanostructure of Co[SiO2] samples by controlled annealing
Author
Denardin, J.C. ; Knobel, M. ; Socolovsky, L.M. ; Brandl, A.L. ; Zhang, X.X.
Author_Institution
Inst. de Fisica Gleb Wataghin, Univ. Estadual de Campinas, Sao Paulo, Brazil
fYear
2003
fDate
March 30 2003-April 3 2003
Lastpage
10
Abstract
In this article, on-line measurements of resistance were made on co-sputtered Co[SiO/sub 2/] /sub 0.65/ granular films during annealing. The aim was to control the thermal treatment parameters and map the microstructural changes in the sample, and the respective magnetotransport response.
Keywords
annealing; cobalt; crystal microstructure; ferromagnetic materials; magnetic thin films; magnetoresistance; nanocomposites; silicon compounds; sputtered coatings; Co-SiO/sub 2/; Co[SiO/sub 2/] nanostructure; annealing; co-sputtered Co[SiO/sub 2/] /sub 0.65/ granular films; magnetotransport response; microstructure; thermal treatment; Annealing; Conductivity; Cooling; Curve fitting; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230705
Filename
1230705
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