• DocumentCode
    2053835
  • Title

    Measuration of Nanometer Grain Content for Complex Material by Spectrophotometric Method

  • Author

    Wang, Dianlong ; Dai, Changsong ; Yi, Tingfeng ; Zhang, Yong ; Zhang, Changsheng ; Sun, Dezhi

  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    403
  • Lastpage
    406
  • Abstract
    The relation of direct proportion between absorbance and nanometer grain content is educed by analysing the extinction law which the monochromatic light passes turbid solution of nanometer grain. The feasibility mensurating nanometer grain content for complex material by spectrophotometric method is verified according to the composite deposit of Ni-P/alpha-Al2O3 (30nm). The results show that the standard curve of relation between the concentration of turbid solution of nanometer grain and absorbance is a straight line, and the linear correlative degree of the data reaches 99.96%. The measuring condition which the incident light wave is 500nm, and the concentration range of alpha-Al2O3 is 8-40mgmiddotL-1 is determined; moreover, the effect of ultrasonic wave dispersion on absorbency of nanometer particle is also studied. So it offers a better method to mensurate nanometer grain content for complex material
  • Keywords
    aluminium compounds; composite materials; grain size; nanostructured materials; nickel compounds; optical properties; phosphorus compounds; spectrophotometry; turbidity; ultrasonic waves; 30 nm; 500 nm; Al2O3; Ni-P; extinction law; mensuration; monochromatic light; nanometer grain content; spectrophotometric method; turbid solution; ultrasonic wave dispersion; Chemical technology; Composite materials; Light scattering; Materials science and technology; Mie scattering; Nanostructured materials; Particle measurements; Particle scattering; Rayleigh scattering; Ultrasonic variables measurement; absorbance; complex material; nanometer grain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334768
  • Filename
    4134980