• DocumentCode
    2054141
  • Title

    Observation and Novel Explanation of Instability of Single Wall Carbon Nanotube

  • Author

    Zhu, Xianfang ; Meng, Tao ; Li, Lunxiong ; Wang, Zhanguo ; Zhou, Huihua ; Shen, Yutian

  • Author_Institution
    Lab. of Low Dimensional Nanostructures, Xiamen Univ.
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    462
  • Lastpage
    465
  • Abstract
    Structural instability of single wall carbon nanotube under electron beam irradiation was investigated by our developed in-situ transmission electron microscopy observation technique. It was observed that the nanotube shrunk and necked in diameter gradually and the curved nanotube shrunk faster in axis direction than straight one with increasing of electron dose during the irradiation. Such athermally induced structural instabilities can be well accounted for by completely new concepts of the nano curvature and the energetic beam-induced soft mode and lattice instability as we recently proposed
  • Keywords
    carbon nanotubes; electron beam effects; lattice dynamics; necking; shrinkage; soft modes; transmission electron microscopy; C; SWNT structural instability; TEM; athermally induced structural instabilities; electron beam irradiation; energetic beam induced lattice instability; energetic beam induced soft mode instability; nanocurvature; nanotube necking; nanotube shrinking; single wall carbon nanotube; transmission electron microscopy; Carbon nanotubes; Electron beams; Laboratories; Lattices; Physics; Semiconductor materials; Semiconductor nanostructures; Shape; Systems engineering and theory; Transmission electron microscopy; SWNT instability; beam-induced soft mode and lattice instability; electron beam irradiation; in-situ TEM observation; nanocurvature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334800
  • Filename
    4134995