Electrostatic interfacial phenomena and I-V characteristics of Au/polyimide Langmuir-Blodgett film/Al element

Author

Li, C.Q. ; Noguchi, Y. ; Manaka, T. ; Wu, H.C. ; Iwamoto, M.

Author_Institution

Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan

fYear

2001

fDate

2001

Firstpage

75

Lastpage

78

Abstract

In this paper, we have analyzed the I-V characteristic of metal (Au)-PI LB film-metal (Al) elements, taking into account the interfacial electrostatic phenomena and the existence of the interfacial electric states at the metal/PI LB film interfaces. A modification of the potential barrier height in the Richardson-Schottky model has been made. It is demonstrated that the interfacial electronic states play an important role in determining the I-V characteristic of the Au-PI LB film-Al structure

Keywords

Langmuir-Blodgett films; MIM structures; aluminium; gold; interface states; polymer films; Au/polyimide Langmuir-Blodgett film/Al element; I-V characteristics; Richardson-Schottky model; interfacial electric states; interfacial electrostatic phenomena; potential barrier height; Conductive films; Dielectric materials; Electrodes; Electrons; Electrostatics; Gold; Mirrors; Polyimides; Potential energy; Resistance heating;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on

Conference_Location

Himeji

Print_ISBN

4-88686-053-2

Type

conf

DOI

10.1109/ISEIM.2001.973567

Filename

973567