• DocumentCode
    2055356
  • Title

    Polycrystalline Diamond Micromechanical Resonators with Nanometer Dimensions

  • Author

    Sepulveda, Nelson ; Aslam, Dean M. ; Sullivan, John P. ; Wendt, Joel R. ; McKenzie, Bonnie B.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Puerto Rico at Mayaguez, Mayaguez
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    662
  • Lastpage
    667
  • Abstract
    This paper reports the fabrication technology and testing of polycrystalline diamond (poly-C) mechanical resonators with dimensions as small as 100 nm for the first time. The fabricated structures include cantilever structures patterned using electron beam lithography to have widths of 100 nm, and torsional paddle resonators with a support beam width of 0.5 mum, which sustained a proof mass around 6.16 times 10-13 Kg. The performance of these structures shows resonant frequencies and quality factor (Q) values in the range of 23 KHz-805 KHz and 9,580-103,600 respectively. The structures were tested using piezoelectric actuation and light interferometer detection techniques. Torsional resonators were fabricated from different poly-C films in order to study the influence of the poly-C film in the resonator Q.
  • Keywords
    cantilevers; diamond; light interferometers; micromechanical resonators; piezoelectric actuators; cantilever structures; electron beam lithography; light interferometer detection techniques; nanometer dimensions; piezoelectric actuation; polycrystalline diamond micromechanical resonators; proof mass; quality factor; support beam; torsional paddle resonators; Electron beams; Fabrication; Lithography; Micromechanical devices; Optical interferometry; Piezoelectric films; Q factor; Resonant frequency; Structural beams; Testing; Cantilever beams; Energy dissipation; polycrystalline diamond; quality factor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334868
  • Filename
    4135041