• DocumentCode
    2056123
  • Title

    Investigation on Surface Forces Measurement Using Force-Balanced MEMS Sensor

  • Author

    Li, Jiang ; Chen, Haosheng ; Li, Yongjian

  • Author_Institution
    Mech. Eng. Sch., Univ. of Sci. & Technol. Beijing, Beijing
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    784
  • Lastpage
    787
  • Abstract
    In order to avoid the displacement of the AFM cantilever in surface forces measurement, a force-balanced MEMS sensor is developed. The probe of the sensor is a pendulous micromachined sensing element, which can be considered as a pair of differential capacitors. When the sensor is designed as a closed-loop system, the electrostatic force feedback can balance the surface force supplied on the sensing probe, and maintain the pendulum of the probe at the balance position. Consequently, when using the force-balanced MEMS sensor, the surface force between two surfaces can be measured with precisely controlled distance, and the displacement of the conventional cantilever is avoided. Experiment on surface force measurement between the pendulum surface of the probe and a ball´s surface is performed, as the distance between the two surfaces is controlled by a nanopositioner.
  • Keywords
    atomic force microscopy; cantilevers; closed loop systems; force feedback; force measurement; force sensors; micromachining; microsensors; nanopositioning; AFM cantilever; closed-loop system; differential capacitors; electrostatic force feedback; force-balanced MEMS sensor; nanopositioner; pendulous micromachined sensing element; surface forces measurement; Atomic force microscopy; Capacitive sensors; Displacement measurement; Electrostatic measurements; Force control; Force feedback; Force measurement; Force sensors; Micromechanical devices; Probes; MEMS sensor; adhesion; closed-loop system; surface force;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334895
  • Filename
    4135068