DocumentCode
2056291
Title
PECVD SiC as a Chemical Resistant Material in MEMS
Author
Guo, Hui ; Wang, Yu ; Chen, Sheng ; Zhang, Guobing ; Zhang, Haixia ; Li, Zhihong
Author_Institution
Inst. of Microelectron., Peking Univ., Beijing
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
805
Lastpage
808
Abstract
Silicon carbide (SiC) is a promising material for the device operating in hash environment, such as high temperature, high pressure or erodent environment, owning to its excellent electrical, mechanical, and chemical properties. The PECVD process allows deposition of SiC at low temperature (200degC-400degC), which makes SiC has better compatibility in Post-CMOS processes. In this paper, PECVD SiC has been investigated as a chemical resistant material in MEMS systematically. SiC was utilized as a coating layer to protect micromachined polysilicon devices from erosive environment and as a wet-etch mask to pattern silicon and glass. SiC was also used to construct microstructures taking the merit of SiC´s chemical stability.
Keywords
CVD coatings; etching; masks; micromachining; micromechanical devices; protective coatings; silicon compounds; MEMS; PECVD; SiC; chemical resistant material; chemical stability; coating layer; erodent environment; hash environment; high pressure; high temperature; micromachined polysilicon devices protection; pattern glass; pattern silicon; post-CMOS processes; temperature 200 degC to 400 degC; wet-etch mask; Chemicals; Coatings; Glass; Mechanical factors; Micromechanical devices; Microstructure; Protection; Resistance; Silicon carbide; Temperature; Device protection; Etch mask; MEMS; PECVD; SiC;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334900
Filename
4135073
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