• DocumentCode
    2056291
  • Title

    PECVD SiC as a Chemical Resistant Material in MEMS

  • Author

    Guo, Hui ; Wang, Yu ; Chen, Sheng ; Zhang, Guobing ; Zhang, Haixia ; Li, Zhihong

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    805
  • Lastpage
    808
  • Abstract
    Silicon carbide (SiC) is a promising material for the device operating in hash environment, such as high temperature, high pressure or erodent environment, owning to its excellent electrical, mechanical, and chemical properties. The PECVD process allows deposition of SiC at low temperature (200degC-400degC), which makes SiC has better compatibility in Post-CMOS processes. In this paper, PECVD SiC has been investigated as a chemical resistant material in MEMS systematically. SiC was utilized as a coating layer to protect micromachined polysilicon devices from erosive environment and as a wet-etch mask to pattern silicon and glass. SiC was also used to construct microstructures taking the merit of SiC´s chemical stability.
  • Keywords
    CVD coatings; etching; masks; micromachining; micromechanical devices; protective coatings; silicon compounds; MEMS; PECVD; SiC; chemical resistant material; chemical stability; coating layer; erodent environment; hash environment; high pressure; high temperature; micromachined polysilicon devices protection; pattern glass; pattern silicon; post-CMOS processes; temperature 200 degC to 400 degC; wet-etch mask; Chemicals; Coatings; Glass; Mechanical factors; Micromechanical devices; Microstructure; Protection; Resistance; Silicon carbide; Temperature; Device protection; Etch mask; MEMS; PECVD; SiC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334900
  • Filename
    4135073