Exchange bias in MnPd/Fe bilayers

Author

Blomqvist, P. ; Krishnan, K.M.

Author_Institution

Dept. of Mater. Sci. & Eng., Washington Univ., Seattle, WA, USA

fYear

2003

fDate

March 30 2003-April 3 2003

Lastpage

12

Abstract

In this paper, we present the MnPd/Fe exchange bias system. The growth as well as the magnetic properties of MnPd/Fe bilayers have been thoroughly investigated by means of X-ray diffraction (XRD), transmission electron microscopy (TEM), and vibrating sample magnetometry (VSM). MnPd/Fe /MgO bilayers with high crystalline quality have been deposited at different temperatures on MgO [001] substrates using the ion-beam sputtering technique. Hysteresis loops from two different bilayers, one sample deposited at 600 /spl deg/C and the other deposited at 800 /spl deg/C.

Keywords

X-ray diffraction; antiferromagnetic materials; coercive force; ferromagnetic materials; ion beam effects; iron; magnesium compounds; magnetic anisotropy; magnetic hysteresis; magnetic thin films; manganese alloys; palladium alloys; sputter deposition; transmission electron microscopy; 600 degC; 800 degC; MgO [001] substrates; MnPd-Fe-MgO; MnPd/Fe bilayers; MnPd/Fe exchange bias system; TEM; X-ray diffraction; XRD; hysteresis loops; ion-beam sputtering; magnetic properties; transmission electron microscopy; vibrating sample magnetometry; Crystallization; Iron; Magnetic force microscopy; Magnetic hysteresis; Magnetic properties; Sputtering; Temperature; Transmission electron microscopy; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Conference_Location

Boston, MA, USA

Print_ISBN

0-7803-7647-1

Type

conf

DOI

10.1109/INTMAG.2003.1230889

Filename

1230889