• DocumentCode
    2057451
  • Title

    Electronic apparatus parameters prediction with adaptive clustering procedure

  • Author

    Shcherbakova, Galyna ; Krylov, Viktor

  • Author_Institution
    Odessa Polytech. Nat. Univ., Odessa, Ukraine
  • fYear
    2010
  • fDate
    23-27 Feb. 2010
  • Firstpage
    139
  • Lastpage
    139
  • Abstract
    In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.
  • Keywords
    electronic products; parameter estimation; pattern clustering; production engineering computing; signal processing; electronic apparatus; noise immunity adaptive clustering; parameter prediction; Automatic testing; Clustering methods; Covariance matrix; Electronic equipment testing; Extrapolation; Iterative methods; Multidimensional systems; Optimization methods; Production; Wavelet domain; Adaptive clustering; noise immunity; parameters prediction; sub-gradient; wavelet transformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
  • Conference_Location
    Lviv-Slavske
  • Print_ISBN
    978-966-553-875-2
  • Electronic_ISBN
    978-966-553-901-8
  • Type

    conf

  • Filename
    5446173
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2057451