• DocumentCode
    2057497
  • Title

    Counting single electrons in a CMOS circuit

  • Author

    Popovic, Radivoje S. ; Lany, Marc

  • Author_Institution
    Ecole Polytech. Fed. de Lausanne, Inst. of Microengineering, Lausanne
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    We describe a device compatible with CMOS technology, which permits to detect a single charge by multiplying it to an easily measurable level. The device is a bipolar transistor optimized for the operation in the Geiger avalanche mode. A single electron, injected through the base- emitter junction, triggers avalanche breakdown in the collector- base junction. The breakdown is then rapidly stopped by a quenching circuit. This cycle produces a voltage pulse at the collector, which corresponds to the injection of a single electron. By counting the pulses, currents down to the atto-Ampere range are measured. The device can be used as a bitstream-generator in a delta-sigma analog-to-digital converter.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; avalanche breakdown; bipolar transistors; CMOS circuit; Geiger avalanche mode; atto-Ampere range; avalanche breakdown; base- emitter junction; bipolar transistor; bitstream-generator; collector- base junction; delta-sigma analog-to-digital converter; quenching circuit; single electron; voltage pulse; Avalanche breakdown; Bipolar transistors; CMOS technology; Charge measurement; Circuits; Current measurement; Electric breakdown; Electron emission; Pulse measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. MIEL 2008. 26th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    978-1-4244-1881-7
  • Electronic_ISBN
    978-1-4244-1882-4
  • Type

    conf

  • DOI
    10.1109/ICMEL.2008.4559222
  • Filename
    4559222