• DocumentCode
    2058614
  • Title

    Challenges and solutions for numerical modeling of nanoMOSFETs

  • Author

    Curatola, G. ; Fiori, G. ; Iannaccone, G.

  • Author_Institution
    Dipt. di Ingegneria dell´´Informazione, Univ. degli Studi di Pisa, Italy
  • Volume
    2
  • fYear
    2003
  • fDate
    12-14 Aug. 2003
  • Firstpage
    535
  • Abstract
    In this paper we discuss the main challenges in the simulation of nanoMOSFETs and present an efficient code for the quantum simulation of ballistic field effect transistors. The code is based on the self-consistent solution in two-dimensions of the Poisson equation, of the Schrodinger equation, and of the continuity equation for ballistic electrons. In addition, our code takes properly into account the effect of strain on the band structure of silicon and on ballistic transport in the channel. The code is a remarkable result, since it demonstrates that quantum simulation of nanoMOSFETs, with realistic structure and doping profile, can be performed with a simple high-end PC, and does not require the huge processor clusters, at it is sometimes been proposed. A discussion on current and future developments of the modeling tools is also presented.
  • Keywords
    MOSFET; Poisson equation; SCF calculations; Schrodinger equation; ballistic transport; band structure; density functional theory; doping profiles; elemental semiconductors; nanotechnology; semiconductor device models; silicon; Poisson equation; Schrodinger equation; Si; ballistic electrons; ballistic field effect transistors; ballistic transport; band structure; continuity equation; density functional theory; doping profile; nanoMOSFET simulation; numerical modeling; quantum simulation; self-consistent solution; silicon; strain effect; Ballistic transport; Capacitive sensors; Doping profiles; Electrons; FETs; Nanostructures; Numerical models; Poisson equations; Schrodinger equation; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1230965
  • Filename
    1230965