Session Circuit design and testing

fYear

2008

fDate

11-14 May 2008

Firstpage

375

Lastpage

375

Abstract

Start of the above-titled section of the conference proceedings record.

Keywords

Circuit synthesis; Circuit testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics, 2008. MIEL 2008. 26th International Conference on

Conference_Location

Nis

Print_ISBN

978-1-4244-1881-7

Type

conf

DOI

10.1109/ICMEL.2008.4559300

Filename

4559300

Link To Document