DocumentCode
2060811
Title
An Improved Multiline model for Precise Estimation of Crosstalk
Author
Sayil, Selahattin ; Rudrapati, Merlyn S. ; Borra, Uday K.
Author_Institution
Lamar Univ., Beaumont
fYear
2007
fDate
20-22 April 2007
Firstpage
239
Lastpage
245
Abstract
This work proposes a novel and accurate crosstalk noise estimation method in the presence of multiple RC lines for use in design automation tools. The proposed model, for the first time, presents a complete multiline noise model by representing active and passive aggressors simultaneously on the victim line. In the model, active aggressors are easily represented by current sources and passive aggressors are accurately modeled as equivalent capacitances. Each current source representing an active aggressor carries the same accuracy as the 2-pi representation. Equivalent capacitances for passive aggressors, on the other hand, consider resistive shielding effect and the realistic exponential aggressor waveform. This approach allows one to obtain a general noise model that considers the effect of many active and passive aggressors and general formulas derived can easily be applied to real cases. Noise peak and width expressions are derived and results are in good agreement with HSPICE results. Results show that average error for noise peak is 4.4% and for the width is 6.8% while allowing for very fast analysis.
Keywords
RC circuits; SPICE; crosstalk; shielding; 2-pi representation; HSPICE results; RC lines; active aggressors; automation tools design; crosstalk noise estimation method; crosstalk precise estimation; current sources; equivalent capacitances; exponential aggressor waveform; general noise model; multiline model; multiline noise model; noise peak; passive aggressors; resistive shielding effect; victim line; Active noise reduction; CMOS technology; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Delay effects; Electronic mail; Integrated circuit interconnections; Integrated circuit noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Region 5 Technical Conference, 2007 IEEE
Conference_Location
Fayetteville, AR
Print_ISBN
978-1-4244-1280-8
Electronic_ISBN
978-1-4244-1280-8
Type
conf
DOI
10.1109/TPSD.2007.4380388
Filename
4380388
Link To Document