• DocumentCode
    2061691
  • Title

    5.6 A 0.13μm fully digital low-dropout regulator with adaptive control and reduced dynamic stability for ultra-wide dynamic range

  • Author

    Bin Nasir, Saad ; Gangopadhyay, Samantak ; Raychowdhury, Arijit

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2015
  • fDate
    22-26 Feb. 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents a discrete-time, fully digital, scan-programmable LDO macro in 0.13μm technology featuring greater than 90% current efficiency across a 50× current range, and 8× improvement in transient response time in response to large load steps. The baseline design features a 128b barrel shifter that digitally controls 128 identical power PMOS devices to provide load and line regulation at the node VREG, for a scan-programmable fine-grained synthetic load. A clocked comparator, which eliminates the need for any bias current, controls the direction of shift, D. The programmable mux-select signals, MUX1 and MUX2, provide controllable closed loop gains, KBARREL, of 1 to 3×. Since at any clock edge only 1, 2 or 3 shifts can occur (depending on the gain setting), fine-grained clock gating is enabled by dividing the 128b shifter into four sections and only enabling the clock to the section(s) where the shift occurs.
  • Keywords
    MOS integrated circuits; adaptive control; clocks; comparators (circuits); load regulation; transient response; adaptive control; barrel shifter; clocked comparator; closed loop gains; digital low-dropout regulator; discrete-time LDO; fine-grained clock gating; line regulation; load regulation; power PMOS devices; programmable mux-select signals; reduced dynamic stability; scan-programmable LDO; size 0.13 mum; storage capacity 128 bit; transient response time; ultrawide dynamic range; Adaptive control; Clocks; Current measurement; Dynamic range; Regulators; Transient analysis; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4799-6223-5
  • Type

    conf

  • DOI
    10.1109/ISSCC.2015.7062944
  • Filename
    7062944