DocumentCode
2065429
Title
The current mirror thermal characterization method and its implementation in a power SOI BJT process
Author
Kim, Jonggook ; Liu, Yun ; De Santis, Joseph A. ; Brisbin, Douglas
Author_Institution
Advanced Process Technology Development
fYear
2004
fDate
13-14 Sept. 2004
Firstpage
305
Lastpage
309
Keywords
Area measurement; Current density; Current measurement; Mirrors; Semiconductor optical amplifiers; Silicon on insulator technology; Temperature; Thermal resistance; Transistors; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting
Print_ISBN
0-7803-8618-3
Type
conf
DOI
10.1109/BIPOL.2004.1365806
Filename
1365806
Link To Document