• DocumentCode
    2068225
  • Title

    Electrical design and demonstration of an embedded high-pin-count LSI chip package

  • Author

    Ohshima, Daisuke ; Sasaki, Hideki ; Mori, Kentaro ; Fujimura, Yuki ; Kikuchi, Katsumi ; Nakashima, Yoshiki ; Funaya, Takuo ; Nishiyama, Tomohiro ; Murakami, Tomoo ; Yamamichi, Shintaro

  • Author_Institution
    Syst. Jisso Res. Labs., NEC Corp., Tokyo
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    482
  • Lastpage
    488
  • Abstract
    Design techniques for an ultra-thin LSI package embedding a high-pin-count LSI chip in the thin package substrate have been developed to achieve the excellent electrical performance, as well as low warpage and high heat removal. The embedded chip package we designed is 27 mm by 27 mm in size and 0.71 mm in thickness with a heat spreader. The package is attained with only three metal layers against the six metal layers of the product flip chip ball grid array (FCBGA) package using the same chip. Although the two power plane layers have been removed from the substrate, the low impedance of the power distribution network (PDN) is achieved by utilizing many bundles of fine vias. A 0.5-mm-thick copper plate attached to the LSI chip´s backside provides the signal return path, and contributes to the flatness of this thin package. It also effectively removes heat from the chip. Our design for a product LSI chip with approximately 1,500 pins demonstrates excellent electrical performance as well as small thickness, low warpage, and a high rate of heat removal. Function tests using an LSI tester and a PC-like system board successfully demonstrate the outstanding performance of the LSI chip.
  • Keywords
    ball grid arrays; chip scale packaging; copper; embedded systems; flip-chip devices; large scale integration; Cu; PC-like system board; copper plate; electrical design; embedded chip package; flip chip ball grid array; heat removal; heat spreader; high-pin-count LSI chip package; power distribution network; signal return path; size 0.5 mm; size 27 nm; warpage; Copper; Electronics packaging; Flip chip; Impedance; Large scale integration; Pins; Power systems; Product design; Resistance heating; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074058
  • Filename
    5074058