• DocumentCode
    2068291
  • Title

    Projection speckle digital correlation for surface out-of-plane deformation measurement

  • Author

    Lu, Hua ; Sun, Cuiru

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Ryerson Univ., Toronto, ON, Canada
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The paper presents a new study on the method of Projection Speckle Digital Correlation (PSDC) for surface out-of-plane displacement and tilt measurement. Considering that perspective and parallel devices differ substantially in the nature of pattern projection and imaging, four different camera-projector setups are modeled by optical triangulation. The different W-u relationships that the models give indicate the impact of the device properties on raw measurement. In assessing overall error sources and error structure in the PSDC measurement, sources and magnitudes of the error in relation to Digital Speckle Correlation (DSC) are evaluated since DSC is a core technique embedded in the P SDC for image in-plane motion extraction. Another category of the errors inherent to the PSDC is analyzed, which is due to the misuse of the field equations. For a particular PSDC setup, such systematic error is correctable by a calibration test using a planar sample with known rigid-body motion. A case application serves as a demonstration of the potential of the low cost system, in which DSC and PSDC are combined to resolve 3D deformation in a 1 mm2 area in a notched tensile sample.
  • Keywords
    correlation methods; deformation; displacement measurement; spatial variables measurement; digital speckle correlation; displacement measurement; projection speckle digital correlation; surface out-of-plane deformation measurement; tilt measurement; Adaptive optics; Cameras; Correlation; Optical imaging; Speckle; Surface treatment; Projection Speckle Digital Correlation; small scale surface measurement; three-di mensional deformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optomechatronic Technologies (ISOT), 2010 International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-7684-8
  • Type

    conf

  • DOI
    10.1109/ISOT.2010.5687392
  • Filename
    5687392