• DocumentCode
    2068488
  • Title

    Electromagnetic compatibility modeling techniques: Past, present and future

  • Author

    Ruehli, Albert E. ; Miersch, Ekkehard

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We consider the evolution of EMC modeling techniques in this companion paper to the keynote address. The impact of work in the past is considered and an overview and summary of the relevant techniques used today is given. We also attempt to predict future trends based on observations on past and todaypsilas progress. Fortunately for the industry, EMC modeling has expanded considerably in the last few years due to its increasing importance. Today, the design of a high performance system without these modeling tools would not be possible. We will limit the presentation to the modeling area. Of course measurements also have an important role in the advances of the state of the art.
  • Keywords
    electromagnetic compatibility; EMC modeling; electromagnetic compatibility modeling techniques; Circuit theory; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic scattering; Maxwell equations; Microprocessors; Packaging; Technological innovation; Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559796
  • Filename
    4559796