• DocumentCode
    2070148
  • Title

    Conductive adhesive flip-chip bonding for bumped and unbumped die

  • Author

    Connell, Glen ; Zenner, Robert L D ; Gerber, Joel A.

  • Author_Institution
    3M Co., St. Paul, MN, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    274
  • Lastpage
    278
  • Abstract
    Conductive adhesive interconnection for flip-chip-on-flex is discussed for both bumped and unbumped die. The flip-chip connections are made by applying heat and pressure to a conductive adhesive film. During the bonding process adhesive is pushed out of the way allowing the conductive particles to connect to the conductive pads and traces. If the proper conditions are applied, a reliable connection is made. The most stable connections were made with a gold-bumped die. However, reliable connections to unbumped die were also demonstrated using gold-coated nickel particles. The samples were prepared by patterning the particles in a grid array and then directing the flow of the adhesive towards the center of the chip rather than outward. This directed flow is accomplished by allowing the, chip to deflect under the influence of the adhesive pressure. Results for both kind of die show that once a good initial contact is made, the resistance is stable in accelerated aging environments
  • Keywords
    adhesion; flip-chip devices; Au-Ni; accelerated aging; bonding; bumped die; conductive adhesive film; flip-chip-on-flex; gold-coated nickel particles; interconnection; resistance; unbumped die; Bonding processes; Conductive adhesives; Contact resistance; Costs; Insulation; Polyethylene; Positron emission tomography; Substrates; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606181
  • Filename
    606181