• DocumentCode
    2070463
  • Title

    Fault simulation basics

  • Author

    Seaton, J.

  • Author_Institution
    Zycad Corp., Menlo Park, CA
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Lastpage
    39814
  • Abstract
    A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test
  • Keywords
    application specific integrated circuits; digital integrated circuits; digital simulation; electronic engineering computing; integrated circuit testing; ASIC; average defect levels; digital circuits; digital faults; economic benefits; empirical examples; fault collapsing algorithms; fault coverage; fault mechanisms; fault modeling techniques; fault simulation; manufacturing test; physical defects; tradeoffs of fault placement; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Electrical fault detection; Manufacturing; Power generation economics; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
  • Conference_Location
    Rochester, NY
  • Type

    conf

  • DOI
    10.1109/ASIC.1989.123161
  • Filename
    123161