DocumentCode
2070463
Title
Fault simulation basics
Author
Seaton, J.
Author_Institution
Zycad Corp., Menlo Park, CA
fYear
1989
fDate
25-28 Sep 1989
Lastpage
39814
Abstract
A description is given of the principles of fault simulation, fault modeling techniques and the economic benefits of fault simulation. The principles of fault simulation are discussed, including serial, parallel, and concurrent fault simulation algorithms. Digital faults, fault coverage, and fault mechanisms typically found in digital circuits are described. The tradeoffs of fault placement, fault collapsing algorithms, and the ability to discover different physical defects through fault simulation are discussed. Economic benefits are shown through empirical examples and through correlating fault coverage to average defect levels resulting after manufacturing test
Keywords
application specific integrated circuits; digital integrated circuits; digital simulation; electronic engineering computing; integrated circuit testing; ASIC; average defect levels; digital circuits; digital faults; economic benefits; empirical examples; fault collapsing algorithms; fault coverage; fault mechanisms; fault modeling techniques; fault simulation; manufacturing test; physical defects; tradeoffs of fault placement; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Costs; Electrical fault detection; Manufacturing; Power generation economics; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1989.123161
Filename
123161
Link To Document