• DocumentCode
    2071316
  • Title

    Effect of package parasitics on conducted and radiated emission with mixed-mode analysis

  • Author

    Paoletti, Umberto ; Hisakado, Takashi ; Wada, Osami

  • Author_Institution
    Dept. of Electr. Eng., Kyoto Univ., Kyoto
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    419
  • Lastpage
    422
  • Abstract
    Based on a case study it is shown that the mixed-mode scattering parameters allow to consider some important effects related to package parasitics, which cannot be explained by considering completely differential type package models. In particular, a differential mode source at IC level can generate a common mode current at package level, which is in part transformed back into differential mode current and flows through the port connected to the PCB. Some design equations based on mixed-mode analysis are proposed, in order to reduce the common mode excitation, and make in this way the package more reliable.
  • Keywords
    integrated circuit modelling; integrated circuit noise; integrated circuit reliability; IC noise; PCB; common mode current; common mode excitation; conducted emission; differential mode current; mixed-mode analysis; mixed-mode scattering parameters; package model; package parasitics; package reliability; radiated emission; Circuit noise; Electromagnetic compatibility; Equations; Frequency; Inductance; Inductors; Integrated circuit modeling; Integrated circuit packaging; Power generation; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559901
  • Filename
    4559901