• DocumentCode
    2071359
  • Title

    Field use environment for a FCBGA in a laptop computer application

  • Author

    Darveaux, Robert ; Reichman, Corey ; Berry, Christopher J.

  • Author_Institution
    Amkor Technol., Inc., Chandler, AZ
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1234
  • Lastpage
    1239
  • Abstract
    A laptop computer was disassembled, and several thermocouples were attached to the die, heat sink, substrate, and motherboard. The laptop was then re-assembled and run under various conditions to measure the effects on temperature distribution. The assembly was then deconstructed and samples were extracted for material property measurements. Elastic modulus and thermal expansivity were measured for the heat sink, substrate, motherboard, thermal interface pad, and underfill materials. Typical temperature rise of the IGP die above ambient was 40 C. Video use increased the temperature by 5 C to 10 C. Wrapping the laptop to constrict airflow increased the temperature by 15 C. Hence, the operating temperature range is approximately 55 C to 80 C. The substrate and motherboard are hotter on the side facing the CPU. There are gradients of up to 20 C in the structure (difference between hottest and coolest regions). The initial temperature change rate during a power cycle is 5 C/sec for the IGP die.
  • Keywords
    ball grid arrays; elastic moduli measurement; flip-chip devices; heat sinks; laptop computers; temperature distribution; thermal expansion measurement; thermal management (packaging); thermocouples; FCBGA package; IGP die; elastic modulus; flip chip ball grid array; heat sink; laptop computer application; material property measurement; temperature 40 C; temperature 5 C to 10 C; temperature 55 C to 80 C; temperature distribution; thermal expansivity; thermal interface pad; thermocouple; underfill materials; Application software; Assembly; Central Processing Unit; Computer applications; Fasteners; Heat sinks; Portable computers; Power dissipation; Temperature distribution; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074169
  • Filename
    5074169