• DocumentCode
    2071470
  • Title

    Modeling feedback bridging faults with non-zero resistance

  • Author

    Polian, Ilia ; Engelke, Piet ; Renovell, Michel ; Becker, Bernd

  • Author_Institution
    Albert-Ludwigs-Univ., Freiburg, Germany
  • fYear
    2003
  • fDate
    25-28 May 2003
  • Firstpage
    91
  • Lastpage
    96
  • Abstract
    We study the behavior of feedback bridging faults with nonzero bridge resistance. We demonstrate that a test vector may detect the fault, not detect the fault or lead to oscillation, depending on bridge resistance. Even loops going through a gate with controlling values on its side inputs (which we call disabled loops) expose non-trivial behavior We outline the multiple strengths problem which arises due to the fact that a critical bridge resistance depends on the strengths of the signals driving the bridge, which in turn are functions of the number of the on-transistors, these again depend on the bridge resistance, making such a fault very hard to resolve. We conclude that the complexity of resistive feedback bridging fault simulation, accurate enough to resolve such situations, will probably be prohibitively high and propose possible simplifying assumptions. We present simulation results for ISCAS benchmarks using these assumptions with and without taking oscillation into account.
  • Keywords
    circuit feedback; circuit oscillations; circuit simulation; fault simulation; integrated circuit modelling; integrated circuit testing; logic simulation; bridge driving signal strengths; bridge resistance; circuit oscillation; disabled loops; fault simulation; feedback bridging fault modeling; multiple strengths problem; nonzero resistance bridging faults; Automatic test pattern generation; Benchmark testing; Bridge circuits; Bridges; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Feedback loop; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop, 2003. Proceedings. The Eighth IEEE European
  • ISSN
    1530-1877
  • Print_ISBN
    0-7695-1908-3
  • Type

    conf

  • DOI
    10.1109/ETW.2003.1231674
  • Filename
    1231674