Modeling of IR-Drop induced delay fault in CNT and GNR power distribution networks

Author

Das, Divya ; Rahaman, Hafizur

Author_Institution

Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur, India

fYear

2012

fDate

17-19 Dec. 2012

Firstpage

1

Lastpage

4

Abstract

The work in this paper analyses the delay fault in logic circuits due to power supply voltage drop (IR-Drop) in carbon nanotube (CNT) and graphene nanoribbon (GNR) interconnects for 16 nm technology node. The electrical equivalent model is used to derive the electrical circuit parameters for CNT and GNR interconnects. The results are compared with that of traditional copper (Cu) based interconnects. It has been found that the delay faults can be reduced using CNT and GNR power interconnects at longer lengths as compared to the traditional Cu based power interconnects.

Keywords

carbon nanotubes; delays; equivalent circuits; fault diagnosis; graphene; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated logic circuits; nanoribbons; C; CNT power distribution network; GNR power distribution network; IR-drop induced delay fault; electrical equivalent model; graphene nanoribbon interconnect; logic circuits; power supply voltage drop; size 16 nm; Carbon nanotube (CNT); delay; graphene nanoribbon (GNR); interconnect; power supply voltage drop (IR drop);

fLanguage

English

Publisher

ieee

Conference_Titel

Computers and Devices for Communication (CODEC), 2012 5th International Conference on

Conference_Location

Kolkata

Print_ISBN

978-1-4673-2619-3

Type

conf

DOI

10.1109/CODEC.2012.6509350

Filename

6509350