• DocumentCode
    2072800
  • Title

    Effects of epoxy and rubber addition on die attach films (DAFs) materials properties

  • Author

    Choi, Yongwon ; Jang, Kyung-Woon ; Chung, Chang-Kyu ; Lee, Sangyong ; Paik, Kyung-Wook

  • Author_Institution
    Dept. of Mater. Sci. & Eng., KAIST, Daejon
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1525
  • Lastpage
    1530
  • Abstract
    The trend for package miniaturization brings new packaging techniques such as 3-D stacking including stacking dies, packages, or modules. In 3-D stacking, die stacking method is widely used compared with package or module stacking methods. Die stacking is usually performed using wire bonding, solder bump, or through silicon via(TSV). Among these methods, wire bonding with die attach films (DAFs) has been widely used because of lower cost and easier process than TSV. DAFs are polymer adhesives used for stacking dies. In this study, the properties of DAFs have been investigated by modifying material formulation such as multi-functional epoxy and acrylonitrile butadiene rubber (NBR). Thermo-mechanical properties such as CTE, modulus, and Tg of DAFs and the die shear strength at high temperature were improved as the multifunctional epoxy content increased. In case of rubber addition, thermo-mechanical properties such as CTE, modulus, and Tg of DAFs were deteriorated as the rubber content increased, while moisture absorption decreased as the rubber content increased. Consequently, effects of epoxy and rubber addition on the materials properties of DAFs were fundamentally studied. These results can be used to optimize the DAFs for 3-D stacking dies.
  • Keywords
    adhesives; elastic moduli; films; glass transition; lead bonding; microassembling; moisture; rubber; thermal expansion; acrylonitrile butadiene rubber; coefficient-of-thermal expansion; die attach films; die shear strength; die stacking; epoxy; glass transition; modulus; moisture absorption; package miniaturization; polymer adhesives; solder bump; thermo-mechanical property; through silicon via; wire bonding; Bonding; Costs; Material properties; Microassembly; Packaging; Rubber; Silicon; Stacking; Thermomechanical processes; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074215
  • Filename
    5074215