• DocumentCode
    2073001
  • Title

    Effect of impurities in the channel of a spin field effect transistor (SPINFET)

  • Author

    Cahay, Marc ; Bandyopadhyay, Supriyo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    12-14 Aug. 2003
  • Firstpage
    171
  • Abstract
    We show that the conductance modulation of Spin Field Effect Transistors (SPINFET) is affected by a single (non-magnetic) impurity in the transistor´s channel. The extreme sensitivity of the amplitude and phase of the transistor´s conductance oscillations to the location of a single impurity in the channel is reminiscent of the phenomenon of universal conductance fluctuations in mesoscopic samples and is extremely problematic as far as device implementation is concerned.
  • Keywords
    current fluctuations; electric admittance; field effect transistors; impurity distribution; semiconductor device models; conductance fluctuations; conductance modulation; impurities effect; mesoscopic samples; spin field effect transistor; transistor channel; transistor conductance oscillations; Computer science; Electrons; FETs; Fluctuations; Impurities; Lighting control; Magnetic fields; Magnetization; Resonance; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1231743
  • Filename
    1231743