• DocumentCode
    2073492
  • Title

    Normality test and characteristic statistic analysis of transient electromagnetic disturbance

  • Author

    Su, Jingfang ; Zhang, Weidong ; Cui, Xiang ; Zhao, Jie ; Li, Xiaolin ; Wang, Qi

  • Author_Institution
    Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Baoding
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    782
  • Lastpage
    785
  • Abstract
    According to the diversity of transient electromagnetic quantity, typical waveforms and spectrums of switching operation are got in transient disturbance; then, the disturbance characteristic of time and frequency domain are analyzed. Mainly the distribution probability and frequency statistic of characteristic parameter are analyzed. Drawing up probability graph of time-domain and envelope diagram of frequency-domain, continue to analyze. Besides, this paper makes a small sample statistic analysis based on statistic theory, utilizes the methods of normality test, such as normal probability test, W-normality test, D-normality test, kurtosis and skewness test, and compares these test methods to get initial conclusions.
  • Keywords
    computational electromagnetics; frequency-domain analysis; probability; time-domain analysis; characteristic statistic analysis; distribution probability; frequency domain; frequency-domain frequency-domain; normality test; probability graph; statistic analysis; switching operation; time-domains; transient disturbance; transient electromagnetic disturbance; transient electromagnetic quantity; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic transients; Frequency domain analysis; Probability; Statistical analysis; Statistical distributions; Testing; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559992
  • Filename
    4559992