• DocumentCode
    2079120
  • Title

    Framed complexity analysis in SystemC for multi-level design space exploration

  • Author

    Wellig, Armin ; Zory, Julien

  • Author_Institution
    Adv. Syst. Technol., STMicroelectronics, Geneva, Switzerland
  • fYear
    2003
  • fDate
    1-6 Sept. 2003
  • Firstpage
    416
  • Lastpage
    423
  • Abstract
    To guarantee efficient system-on-a-chip (SoC) solutions, design space exploration at various abstraction levels is needed. In this paper, we describe a simulation framework, which is particularly suited for multi-level exploration. Identifying the capturing of design metrics and their incorporation into an exploration framework as the main tasks to be resolved, we will propose a flexible monitoring tool implemented in SystemC to tackle the first item. We present a unified approach to capture and record behavioral, storage and communication characteristics at several abstraction levels of a typical SoC design flow. Figures such as increase in simulation time are included to characterize the developed tool. To address the design decision-making criteria, relevant design metrics are defined for each abstraction level. We distinguish among four distinct levels modeling algorithm and architecture transitions. Finally, iteration control aspects of Turbo decoders used in wireless systems serve as a case study.
  • Keywords
    circuit CAD; circuit simulation; computational complexity; logic simulation; system-on-chip; SystemC; complexity analysis; decision making; design metrics; design space exploration; multilevel exploration; system-on-chip; Algorithm design and analysis; Application software; Communication system control; Delay estimation; Design optimization; Digital systems; Hardware; Power system modeling; Space exploration; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, 2003. Proceedings. Euromicro Symposium on
  • Conference_Location
    Belek-Antalya, Turkey
  • Print_ISBN
    0-7695-2003-0
  • Type

    conf

  • DOI
    10.1109/DSD.2003.1231975
  • Filename
    1231975