DocumentCode
2079364
Title
Simulated faults on directional, ground, overcurrent relays with emphasis on the operational impact on mutually coupled, intact lines
Author
Homeyer, J.W. ; Etezadi-Amoli, M.
Author_Institution
Sierra Pacific Power Co., Reno, NV, USA
Volume
3
fYear
2000
fDate
23-27 Jan 2000
Firstpage
1911
Abstract
It is common practice to build two unrelated circuits on the same physical pole structures. When a ground fault occurs in one line of the mutually coupled pair, it can induce sufficient current in the intact line to cause a false trip. This is an effect of the zero sequence current. From an active transmission system, three pairs of 120 kV transmission lines were selected for investigation. Both double and single line-to-ground faults were simulated with and without mutual coupling. The resulting ground currents reported at the directional, ground, overcurrent relays that protect these lines were compared and the time-over-current settings of these relays were examined. The maximum current on the intact line does not occur at the common bus. It occurs at a point where the mutually coupled lines separate. This phenomenon must be considered in the design of the protection scheme
Keywords
overcurrent protection; power system simulation; power transmission faults; power transmission lines; power transmission protection; relay protection; 120 kV; EMI; active transmission system; directional relays; double line-to-ground faults; false trip; ground fault; ground relays; mutually coupled pair; overcurrent relays; pole structures; power system modelling; power system simulation; power transmission lines; simulated faults; single line-to-ground faults; time-over-current settings; transmission lines; unrelated circuits; zero sequence current; Circuit faults; Coupling circuits; Mutual coupling; Power system modeling; Power system protection; Power system relaying; Power system simulation; Protective relaying; Relays; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society Winter Meeting, 2000. IEEE
Print_ISBN
0-7803-5935-6
Type
conf
DOI
10.1109/PESW.2000.847645
Filename
847645
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