• DocumentCode
    2081325
  • Title

    Development of reflowable Sn-Pb alloy bump for Al pad

  • Author

    Ogashiwa, Toshinori ; Arikawa, Takatoshi ; Inoue, Akihisa

  • Author_Institution
    Tanaka Denshi Kogyo Co. Ltd., Mitaka, Japan
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    664
  • Lastpage
    669
  • Abstract
    A direct soldering material with Al thin-film pad has been examined for a bare flip-chip bonding on Printed Wiring Board. A solder ball made from the. 59.6Sn-29Pb-5Sb-1Zn-5Ag-0.2Cu-0.2Ni (mass%) alloy wire was thermosonically bonded on the Al-1%Si pad by using a conventional bump bonding machine. For fine-pitch bonding, the strain of ball deformation can be reduced by finding the optimum value of the ultrasonic power for bond strength and ellipticity of the bonded bump. After reflow treatment up to 300°C, no significant degradation of the bump shear force was observed. The concentration of Ag, Cu and Ni in the Al film interface results in an improvement in heat-resistance at the bond interface against the high reflow temperatures. Furthermore, the consistency of measured resistance values during thermal cycling, high-temperature and high-humidity and pressure cooker tests were sufficient enough to put into practical use in epoxy encapsulated flip-chip assemblies
  • Keywords
    aluminium; fine-pitch technology; flip-chip devices; lead alloys; lead bonding; printed circuit manufacture; reflow soldering; tin alloys; 300 C; Al; Al thin-film pad; Sn-Pb; Sn-Pb alloy bump; bond strength; ellipticity; epoxy encapsulation; fine-pitch bonding; flip-chip bonding; heat resistance; high humidity; high temperature; interface; pressure cooker; printed wiring board; reflow solder ball; shear force; strain; thermal cycling; thermosonic bonding; ultrasonic power; Aluminum alloys; Bonding; Capacitive sensors; Soldering; Temperature; Thermal degradation; Thermal resistance; Transistors; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606242
  • Filename
    606242