• DocumentCode
    2083118
  • Title

    Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2009-2011

  • Author

    Bowles-Martinez, J.N. ; Thorbourn, D.O. ; Rax, B.G. ; Kenna, A.J. ; Harris, R.D. ; Scheick, L.Z. ; Allen, G.R. ; McClure, S.S.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    This paper reports on the Total Ionizing Dose results for tests performed at JPL from 2009 to 2011. Various microelectronic devices were evaluated to support upcoming missions and research and development projects.
  • Keywords
    integrated circuit testing; integrated circuits; radiation effects; Jet Propulsion Laboratory; ionizing dose test results; microelectronic devices; total ionizing dose; Degradation; Laboratories; Performance evaluation; Pollution measurement; Propulsion; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062502
  • Filename
    6062502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083118